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Cover image for book Statistical Process Monitoring Using Advanced Data-Driven and Deep Learning Approaches

Statistical Process Monitoring Using Advanced Data-Driven and Deep Learning Approaches

By:Fouzi Harrou; Ying Sun; Amanda S. Hering; Muddu Madakyaru; abdelkader Dairi
Publisher:Elsevier S & T
Print ISBN:9780128193655
eText ISBN:9780128193662
Edition:0
Format:Reflowable

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