Microwave Electronics: Measurement and Materials Characterization
| By: | L. F. Chen; C. K. Ong; C. P. Neo; V. V. Varadan; Vijay K. Varadan |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9780470844922 |
| eText ISBN: | 9780470020456 |
| Edition: | 1 |
| Format: | Page Fidelity |
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