Characterization and Control of Interfaces for High Quality Advanced Materials
| By: | Kevin Ewsuk; Kiyoshi Nogi; Markus Reiterer; Antoni Tomsia; S. Jill Glass; Rolf Waesche; Keizo Uemats |
| Publisher: | Wiley Global Research (STMS) |
| Print ISBN: | 9781574981704 |
| eText ISBN: | 9781118406045 |
| Edition: | 1 |
| Format: | Page Fidelity |
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